Instruments

DANFIX has currently 5 instruments, of which three are CT scanners for general use. These cover a range of different options with respect to:

We have local equipment covering a range of different options with respect to:

  • sample dimensions 
  • resolutions
  • energies – for optimising contrast and/or penetration through various material types
  • sample mounts, including environments for in situ investigations

The list below summarises the most prominent features of each of our instruments. Please contact us directly if you require additional details or have more specialised needs. We are experienced in developing and accommodating custom made sample environments.

Micro-CTwith a resolution of 1-50 µm in samples 1-50 mm. 

The maximum power of the instrument is 10 W, and the energy of the employed X-rays can be varied in the range 40-150 keV to optimise contrast; lower energies for light materials, like biological samples, and higher energies to penetrate heavier materials, for instance metallic components.

Specialised sample mounts exist for different types of samples, including options for temperature control and gas flow.

This instrument can penetrate larger and/or heavier specimens because of the higher energies available (up to 225 keV). The maximum field of view is 35 cm corresponding to a resolution of 200 µm, while the best achievable resolution is around 5 µm for mm-sized samples. Owing to the superior power (up to 225 W) the Nikon XT H 225 offers significantly faster imaging than the ZEISS Xradia 410 Versa for sample sizes between 5 mm and 5 cm at a comparable resolution.

Micro-CT with a resolution of 1-50 µm in samples 1-50 mm.

The maximum power of the instrument is 10 W, and the energy of the employed X-rays can be varied in the range 30-160 keV to optimize contrast; lower energies for light materials, like biological samples, and higher energies to penetrate heavier materials, for instance metallic components.

The system is equipped with the Diffraction Contrast Tomography (DCT) module which allows for 3 dimensional mapping of crystal orientations in polycrystalline materials.

Specialized sample mounts exist for different types of samples, including options for temperature control and gas flow.